Probing the Local Chemical and Structural Ordering of Iron Oxyfluoride
نویسندگان
چکیده
Scanning transmission electron microscopy (STEM)-electron energy loss spectroscopy (EELS) has been used for studying local structure of the energy related materials. High resolution (Cs-corrected) STEM is regarded as a promising technique to observe morphological evolution and atomic arrangement inside single particles. Combining with EELS technique, one could probe the local chemical structure therefore to give the high spatial resolution information on the chemical evolution, which information could not be obtained by other characterization techniques, such as X-ray diffraction (XRD) and X-ray absorption spectroscopy (XAS).
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